Technical Program

326: EM and EMC Metrology

Session Type: Oral
Time: Wednesday, July 10, 13:10 - 17:00
Location: Iris/Hibiscus
Session Chairs: Christopher Holloway, National Institute of Standards and Technology and Luis Gomez, University of Michigan
 
326.1: RYDBERG ATOM BASED SELF-CALIBRATING RF E-FIELD PROBE
         Christopher Holloway; NIST, United States
         Josh Gordon; NIST, United States
         Steven Jefferts; NIST, United States
         Thomas Heavner; NIST, United States
 
326.2: UNCERTAINTY QUANTIFICATION IN TRANSCRANIAL MAGNETIC STIMULATION
         Luis Gomez; University of Michigan, United States
         Yücel Abdulkadir; University of Michigan, United States
         Luis Hernandez-Garcia; University of Michigan, United States
         Eric Michielssen; University of Michigan, United States
 
326.3: TERAHERTZ SPECTROSCOPY OF PHOTOVOLTAIC SEMICONDUCTORS
         Nathan Burford; University of Arkansas, United States
         Magda El-Shenawee; University of Arkansas, United States
 
326.4: INVESTIGATING ELECTROMAGNETIC SUSCEPTIBILITY OF CABLES AND ELECTRONICS ENCLOSED WITHIN A COMPLEX PLATFORM
         Yang Shao; The Ohio State University, United States
         Wan-Chun Liao; The Ohio State University, United States
         Zhen Peng; The Ohio State University, United States
         Jin-Fa Lee; The Ohio State University, United States
 
326.5: MILLIMETER AND SUBMILLIMETER PLANAR MEASUREMENT SETUP
         Ana Arboleya; Universidad de Oviedo, Spain
         Yuri Álvarez; Universidad de Oviedo, Spain
         Fernando Las-Heras; Universidad de Oviedo, Spain
 
326.6: NON-CONTACT HUMAN BODY TEMPERATURE MEASUREMENT USING MICROWAVE
         Ki Beom Kim; Korea Advanced Institute of Science and Technology, Republic of Korea
         Jee Hoon Lee; Korea Advanced Institute of Science and Technology, Republic of Korea
         Seong Ook Park; Korea Advanced Institute of Science and Technology, Republic of Korea
 
326.7: AN IMPULSE ELECTROMAGNETIC INTERFERENCE SHIELDING BASED ON A DIODE GRID
         Yangjun Zhang; Ryukoku University, Japan
         Mengqing Yuan; Wave Computation Technologies, Inc., United States
         Qing Huo Liu; Duke Universtiy, United States
 
326.8: A FAST TRANSIENT ANALYSIS OF RADIATION FROM REFLECTOR ANTENNAS USING THE EXPANSION OF FEEDING FIELDS VIA COMPLEX SOURCE BEAMS
         Hsi-Tseng Chou; Yuan Ze University, Taiwan
         Prabhakar Pathak; The Ohio State University, United States
 
326.9: A PHASE-MATCHING BASED PHASE CENTER DETERMINATION METHOD FOR OATS ANTENNA CALIBRATION
         Zhenfei Song; National Institute of Metrology (NIM), China
         Ming Xie; National Institute of Metrology (NIM), China
         Weilong Wang; National Institute of Metrology (NIM), China
         Xiaoxun Gao; National Institute of Metrology (NIM), China
 
326.10: FAR FIELD CHARACTERISTICS OF AN ARBITRARILY ORIENTED ELECTRIC DIPOLE LOCATED ABOVE LAYERED ANISOTROPIC HALF SPACE
         Le Cao; Xidian University, China
         Wei Bing; Xidian University, China
         He Qiong; National Supercomputing Center, China
         Ge De-Biao; Xidian University, China