Technical Program

226: EM Measurements: Antennas and Imaging

Session Type: Oral
Time: Tuesday, July 9, 13:10 - 14:50
Location: Iris/Hibiscus
Session Chairs: Michael Francis, National Institute of Standards and Technology and Rodney G. Vaughan, Simon Fraser University
 
226.1: A DIFFERENTIAL CP MEASUREMENT METHOD
         Ronald Johnston; University of Calgary, Canada
         Jane Yun; Simon Fraser University, Canada
         Rodney Vaughan; Simon Fraser University, Canada
 
226.2: TIME EFFICIENT NF TEST TECHNIQUE FOR AIT/AIV WITH STATIONARY SATELLITE
         Giorgio Giordanengo; Istituto Superiore Mario Boella, Italy
         Francesca Vipiana; Politecnico di Torino, Italy
         Lars Jacob Foged; SATIMO - Italian Office, Italy
         Lucia Scialacqua; SATIMO - Italian Office, Italy
         Francesco Saccardi; SATIMO - Italian Office, Italy
         Mauro Bandinelli; IDS - Ingegneria Dei Sistemi S.p.A., Italy
         Mirko Bercigli; IDS - Ingegneria Dei Sistemi S.p.A., Italy
         Giancarlo Guida; IDS - Ingegneria Dei Sistemi S.p.A., Italy
         Marco Sabbadini; European Space Agency ESA-ESTEC, Netherlands
         Giuseppe Vecchi; Politecnico di Torino, Italy
 
226.3: NEAR-FIELD TO FAR-FIELD TRANSFORMATION BASED ON STRATTON-CHU FOMULA FOR EMC MEASUREMENTS
         Jeong-Seok Lee; Yonsei University, Republic of Korea
         Tae-Lim Song; Yonsei University, Republic of Korea
         Jin-Kyoung Du; Yonsei University, Republic of Korea
         Jong-Gwan Yook; Yonsei University, Republic of Korea
 
226.4: ANALYSIS OF A 3D MICROWAVE IMAGING SYSTEM
         Mohammad Asefi; University of Manitoba, Canada
         Majid Ostadrahimi; University of Manitoba, Canada
         Joe LoVetri; University of Manitoba, Canada
         Lotfollah Shafai; University of Manitoba, Canada
 
226.5: WAVEVECTOR MAPPING FOR ANTENNA EMISSION BY FOURIER TRANSFORM OF COMPLEX ELECTROOPTIC IMAGES
         Masahiro Tsuchiya; National Institute of Information and Communications Technology, Japan
         Takahiro Shiozawa; Kagawa National College of Technology, Japan